1 edition of Radiation Effects in Semiconductors and Semiconductor Devices found in the catalog.
|Statement||by V. S. Vavilov, N. A. Ukhin|
|Contributions||Ukhin, N. A.|
|The Physical Object|
|Format||[electronic resource] /|
|Pagination||1 online resource.|
There is a need to understand and combat potential Radiation damage problems in semiconductor devices and circuits. This book explains the effects of Radiation on semiconductor devices, Radiation detectors, and electronic devices and components. It explores the applications, detector technologies, and circuit design techniques. Total-Dose Radiation Effects Data for Semiconductor Devices Supplement Keith E. Martin James R. Coss Charles A. Goben David C. Shaw Sam Farmanesh Michael M. Davarpanah LeRoy H. Craft William E. Price Febru National Aeronautics and Space Administration Jet Propulsion Laboratory California Institute of Technology Pasadena, CaliforniaFile Size: 6MB.
The updated and enlarged new edition of this book provides an introduction to and an overview of semiconductor optics from the IR through the visible to the UV. It includes coverage of linear and nonlinear optical properties, dynamics, magneto- and electrooptics, high-excitation effects, some applications, experimental techniques and group theory. Another significant class of radiation effects on semiconductor circuits is represented by SEEs, which are either temporary or permanent in nature. Temporary effects include single event upset (SEU) and single event transient (SET). The permanent effects are single event latchup (SEL), single event burnout (SEB) and single event snapback (SES).
Although semiconductor inspection equipment is using low energy X-ray from 40 keV to keV, Studies of radiation damage about the low energy X-ray are lacking circumstance in our country. Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation (particle radiation and high-energy electromagnetic radiation), especially for environments in outer space and high-altitude flight, around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.
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This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are : $ Radiation Effects in Semiconductors and Semiconductor Devices th Edition by V.
Vavilov (Editor) ISBN ISBN Why is ISBN important. ISBN. This bar-code number lets you verify that you're getting exactly the right version or edition of a book. Format: Paperback. Radiation Effects in Semiconductors and Semiconductor Devices Radiation Effects in Semiconductors and Semiconductor Devices.
Editors: Vavilov, V. (Ed.) Free Preview. Buy this book eB68 Radiation Effects in Semiconductor Diodes. Pages Brand: Springer US. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when.
Radiation Effects in Semiconductors and Semiconductor Devices. Authors; V. Vavilov; N. Ukhin; Book. 10 Citations; Experimental Study of Radiation Defects in Semiconductors and Control of Semiconductor Properties by Irradiation. Effect of Pulsed Radiation on Semiconductor Devices. Vavilov, N. Ukhin.
Pages Back Matter. Radiation effects in semiconductors and semiconductor devices. New York: Consultants Bureau, © (OCoLC) Document Type: Book: All Authors / Contributors: V S. In book: Radiation Effects in Semiconductor Devices, Chapter: Nanocrystal Memories an evolutionary approach to Flash memory scaling and a class of radiation tolerant devices, Publisher: CRC Press.
Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can : Krzysztof Iniewski.
Radiation Effects In Semiconductors by Krzysztof Iniewski / / English / PDF. Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause.
This book analyzes the radiation problem, focusing on the most. Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices.
The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important. This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are by: Introduction to Radiation-Resistant Semiconductor Devices and Circuits Helmuth Spieler Ernest Orlando Lawrence Berkeley National Laboratory, Physics Division, 1 Cyclotron Road, Berkeley, CAUSA Abstract This tutorial paper provides an overview of design considerations for semiconductor radiation detectors and electronics in high.
Book Description Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany, Hardback. Condition: New. Language: English. Brand new Book. This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments.5/5(1).
This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated.
One --I The Theory of the Formation and Nature of Radiation-Induced Defects --II Experimental Study of Radiation Defects in Semiconductors and Control of Semiconductor Properties by Irradiation --III Ionization in Semiconductors as a Result of the Stopping of Charged Particles, Absorption and Scattering of Photons --Two --I Radiation Effects in.
Radiation Effects in Advanced Semiconductor Materials and Devices (Springer Series in Materials Science) C. Claeys, E. Simoen This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments.
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Radiation Effects in Semiconductors (Devices, Circuits, and Systems) Krzysztof Iniewski Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits.
The properties of semiconductor diodes, like those of other semiconductor devices are greatly influenced by irradiation. Thus, both branches of the V—I curve are changed. However, the magnitude of those changes depends on the type of semiconductor, on the design of Author: V. Vavilov, N. Ukhin.
In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur.The book examines data on radiation effects in semiconductor devices such as p-n junctions, diodes, laser emitting diodes, bipolar transistors and thyristors, MOS structures, and integrated circuits, and discusses models for explaining these effects.
Topics investigated include stable changes in the current-voltage characteristics of p-n junctions under irradiation, effect of radiation on.Effects of X-ray radiation to the surface-state density in a metal-oxide- semiconductor structure Journal Article Ellialtioglu, R M ; Sencer, O - Tech.
J. Ankara Nucl. Res. Cent., v. 1, no. 1, pp.